Often help the life of electronic components working condition, but by storing to determine damage caused by

In laboratory and field applications of electronic components in a variety of conditions, operational reliability has been a lot of work, but also published a lot of information. However, in the military utility when the life of electronic components often determined not by working status, but the damage caused by the store to decide.  electri cenergy meter store one year, five years or even ten years. After storage, these devices must immediately be able to work properly. And some equipment has been  mcb circuit breaker  their useful life, in fact, electronic components, the life time of the long-term storage tests are difficult to implement, because: 1. Was not enough time to do such tests. 2 is expected to be less efficient storage failure (failure rate of about 0.01 to work 0.1), therefore, failure to obtain a variety of practical efficiency (with small statistical errors), then the required number of test samples. If you can find a reasonable accelerated test method, not only shorten the test time, but also reduce the cost of evaluation of the effect of storage devices. Storage environment to define various conditions must be manufactured from the elements until the beginning of the end of useful life are taken into account.